The Development Trends of Computing Equipment and Issues Related to Electronic Modelling
| Authors: Kovalenko S.M., Platonova O.V., Mikitin V.M. | Published: 04.12.2015 |
| Published in issue: #12(669)/2015 | |
| Category: Technology and Process Machines | |
| Keywords: computing equipment, electronic modelling, level of micro-electronic technology, microcircuit complexity level, processing time and interference resistance of digital equipment |
The authors of the article study the relationship between the level of semiconductor technology characterized by the transistor channel length and the crystal parameters (size and complexity factor) in a wide range of values. The base factor of lithography resolution capacity, which remains the same at every stage of technology development, is the foundation of the study. The authors propose mathematical models describing the relationships between the size of the crystal, its complexity factor, technology level as well as taking into account the type, topological norms and initial channel lengths of transistors. An updated description of the development of generations of computing equipment is provided with regard to the technology level and complexity factor of the elements.
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